![]() ![]() In addition to phase identification, it also reveals information on how internal stresses and flaws cause actual structures to diverge from ideal ones. Identification of materials based on their diffraction pattern is one of the main applications of XRD analysis. These waves interfere destructively in the vast majority of directions, but according to Bragg’s law, they add constructively in the following few directions:ĭ is the distance between diffracting planes, and The diffraction patterns give information like phase, atomic plane spacing (d-spacing), crystal structure, preferred orientation (texture), average grain size, crystallinity, strain, crystallite size, crystal defects, etc.Ī regular array of spherical waves results from a regular array of scatterers. The electron is the scatterer in this event, which is referred to as elastic scattering. In a diffractometer, incident X-rays are scattered (diffracted) at specific angles from the sample’s lattice planes, resulting in diffraction peaks characteristic of simple’s crystal structure. X-ray diffraction patterns are unique to the periodic atomic arrangements in a specimen and are widely used for phase identification. X-Ray Diffraction analysis (XRD) is a characterization technique used for crystalline materials. ![]()
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